CM-Bench: A Comprehensive Cross-Modal Feature Matching Benchmark Bridging Visible and Infrared Images

作者：Liangzheng Sun, Mengfan He, Xingyu Shao, Binbin Li, Zhiqiang Yan, Chunyu Li, Ziyang Meng, Fei Xing · 单位：School of Instrument Science and Opto-Electronics Engineering, Beijing Information Science and Technology University, Beijing 100192, China, Department of Precision Instrument, Tsinghua University, Beijing 100084, China · 会议/期刊：arXiv preprint · 方向：6D位姿 · 发布日期：2026-03-13